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| 2005 | ||
|---|---|---|
| 1 | EE | S. Azzopardi, A. Benmansour, M. Ishiko, E. Woirgard: Assessment of the Trench IGBT reliability: low temperature experimental characterization. Microelectronics Reliability 45(9-11): 1700-1705 (2005) |
| 1 | S. Azzopardi | [1] |
| 2 | A. Benmansour | [1] |
| 3 | E. Woirgard | [1] |