2001 |
4 | EE | Julia Dushina,
Mike Benjamin,
Daniel Geist:
Semi-Formal Test Generation with Genevieve.
DAC 2001: 617-622 |
3 | EE | Julia Dushina,
Mike Benjamin,
Daniel Geist:
Semi-Formal Test Generation for a Block of Industrial DSP.
VTS 2001: 131-137 |
1999 |
2 | EE | Mike Benjamin,
Daniel Geist,
Alan Hartman,
Gérard Mas,
Ralph Smeets,
Yaron Wolfsthal:
A Study in Coverage-Driven Test Generation.
DAC 1999: 970-975 |
1996 |
1 | EE | Françoise Casaubieilh,
Anthony McIsaac,
Mike Benjamin,
Mike Bartley,
François Pogodalla,
Frédéric Rocheteau,
Mohamed Belhadj,
Jeremy Eggleton,
Gérard Mas,
Geoff Barrett,
Christian Berthet:
Functional Verification Methodology of Chameleon Processor.
DAC 1996: 421-426 |