| 2005 |
|---|
| 4 | EE | Weiping Liao,
Joseph M. Basile,
Lei He:
Microarchitecture-level leakage reduction with data retention.
IEEE Trans. VLSI Syst. 13(11): 1324-1328 (2005) |
| 2004 |
|---|
| 3 | EE | Fei Li,
Lei He,
Joseph M. Basile,
Rakesh J. Patel,
Hema Ramamurthy:
High-level area and power-up current estimation considering rich cell library.
ASP-DAC 2004: 899-904 |
| 2003 |
|---|
| 2 | EE | Fei Li,
Lei He,
Joseph M. Basile,
Rakesh Patel,
Hema Ramamurthy:
High Level Area and Current Estimation.
PATMOS 2003: 259-268 |
| 2002 |
|---|
| 1 | EE | Weiping Liao,
Joseph M. Basile,
Lei He:
Leakage power modeling and reduction with data retention.
ICCAD 2002: 714-719 |
