W. H. Gerling
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2006
1
EE
L. J. Balk
, W. H. Gerling,
E. Wolfgang
: Editorial.
Microelectronics Reliability 46
(9-11): 1401-1402 (2006)
Coauthor
Index
1
L. J. Balk
[
1
]
2
E. Wolfgang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
