| |
| 2002 | ||
|---|---|---|
| 1 | EE | Tom Austin, Charisma Canlas, Brady Morgan, Jorge Luis Rodriguez: Across the Great Divide: Examination of Simulation Data with Actual Silicon Waveforms Improves Device Characterization and Production Test Development. ITC 2002: 270-279 |
| 1 | Tom Austin | [1] |
| 2 | Charisma Canlas | [1] |
| 3 | Jorge Luis Rodriguez | [1] |