Philip H. Noel

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1EEW. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel: Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM Journal of Research and Development 43(3): 407-416 (1999)

Coauthor Index

1W. W. (Bill) Abadeer [1]
2Asmik Bagramian [1]
3David W. Conkle [1]
4Charles W. Griffin [1]
5Eric Langlois [1]
6Brian F. Lloyd [1]
7Raymond P. Mallette [1]
8James E. Massucco [1]
9Jonathan M. McKenna [1]
10Steven W. Mittl [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)