| |
| 1999 | ||
|---|---|---|
| 1 | EE | W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel: Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM Journal of Research and Development 43(3): 407-416 (1999) |
| 1 | W. W. (Bill) Abadeer | [1] |
| 2 | Asmik Bagramian | [1] |
| 3 | David W. Conkle | [1] |
| 4 | Charles W. Griffin | [1] |
| 5 | Eric Langlois | [1] |
| 6 | Brian F. Lloyd | [1] |
| 7 | Raymond P. Mallette | [1] |
| 8 | James E. Massucco | [1] |
| 9 | Jonathan M. McKenna | [1] |
| 10 | Steven W. Mittl | [1] |