| |
| 2006 | ||
|---|---|---|
| 3 | EE | Weihua Liu, Changchun Zhu, Cao Meng, Fanguang Zeng: On the uniformity of field emission in screen printed CNT-cathodes: The effects of the cathode roughness. Microelectronics Journal 37(5): 404-408 (2006) |
| 2005 | ||
| 2 | EE | Ying Wang, Changchun Zhu, Chunyu Wu, Junhua Liu: Improving reliability of beveled power semiconductor devices passivated by SIPOS. Microelectronics Reliability 45(3-4): 535-539 (2005) |
| 2002 | ||
| 1 | EE | Shoucai Yuan, Changchun Zhu: An IGBT DC subcircuit model with non-destructive parameters extraction and comparison with measurements. Microelectronics Reliability 42(12): 1991-1996 (2002) |
| 1 | Junhua Liu | [2] |
| 2 | Weihua Liu | [3] |
| 3 | Cao Meng | [3] |
| 4 | Ying Wang | [2] |
| 5 | Chunyu Wu | [2] |
| 6 | Shoucai Yuan | [1] |
| 7 | Fanguang Zeng | [3] |