Chunyu Wu
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2005
1
EE
Ying Wang
,
Changchun Zhu
, Chunyu Wu,
Junhua Liu
: Improving reliability of beveled power semiconductor devices passivated by SIPOS.
Microelectronics Reliability 45
(3-4): 535-539 (2005)
Coauthor
Index
1
Junhua Liu
[
1
]
2
Ying Wang
[
1
]
3
Changchun Zhu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
