Shoucai Yuan

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2002

1 EE Shoucai Yuan, Changchun Zhu: An IGBT DC subcircuit model with non-destructive parameters extraction and comparison with measurements. Microelectronics Reliability 42(12): 1991-1996 (2002)

2002
1	EE	Shoucai Yuan, Changchun Zhu: An IGBT DC subcircuit model with non-destructive parameters extraction and comparison with measurements. Microelectronics Reliability 42(12): 1991-1996 (2002)

Coauthor Index

1 Changchun Zhu [1]