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2008 | ||
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1 | EE | Huifei Rao, Jie Chen, V. H. Zhao, Woon Tiong Ang, I-Chyn Wey, An-Yeu Wu: An efficient methodology to evaluate nanoscale circuit fault-tolerance performance based on belief propagation. ISCAS 2008: 608-611 |
1 | Woon Tiong Ang | [1] |
2 | Jie Chen | [1] |
3 | Huifei Rao | [1] |
4 | I-Chyn Wey | [1] |
5 | An-Yeu Wu | [1] |