| |
| 2007 | ||
|---|---|---|
| 1 | EE | Hongfei Liu, Alin Hou, Hongbo Zhang, Daming Zhang, Maobin Yi: A voltage calibration technique of electro-optic probing for characterization internal to IC's chip. Microelectronics Reliability 47(1): 82-87 (2007) |
| 1 | Hongfei Liu | [1] |
| 2 | Maobin Yi | [1] |
| 3 | Daming Zhang | [1] |
| 4 | Hongbo Zhang | [1] |