2007 | ||
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1 | EE | Hongfei Liu, Alin Hou, Hongbo Zhang, Daming Zhang, Maobin Yi: A voltage calibration technique of electro-optic probing for characterization internal to IC's chip. Microelectronics Reliability 47(1): 82-87 (2007) |
1 | Alin Hou | [1] |
2 | Hongfei Liu | [1] |
3 | Daming Zhang | [1] |
4 | Hongbo Zhang | [1] |