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Ryozou Yoshino

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1995
3 Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino: A Gate-Array-Based 666MHz VLSI Test System. ITC 1995: 451-458
1989
2 Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi: A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566
1985
1 Ryozou Yoshino, Ryuichi Takagi: Custom VLSI Test System. ITC 1985: 431-437

Coauthor Index

1Yoshihiko Hayashi [2] [3]
2Masahiko Kaneko [3]
3Shuji Kikuchi [2] [3]
4Takashi Matsumoto [2] [3]
5Jun Saitou [3]
6Takashi Suga [3]
7Ryuichi Takagi [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)