| |
| 1989 | ||
|---|---|---|
| 2 | Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi: A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566 | |
| 1985 | ||
| 1 | Ryozou Yoshino, Ryuichi Takagi: Custom VLSI Test System. ITC 1985: 431-437 | |
| 1 | Yoshihiko Hayashi | [2] |
| 2 | Shuji Kikuchi | [2] |
| 3 | Takashi Matsumoto | [2] |
| 4 | Ryozou Yoshino | [1] [2] |