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Ryuichi Takagi

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1989
2 Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi: A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. ITC 1989: 558-566
1985
1 Ryozou Yoshino, Ryuichi Takagi: Custom VLSI Test System. ITC 1985: 431-437

Coauthor Index

1Yoshihiko Hayashi [2]
2Shuji Kikuchi [2]
3Takashi Matsumoto [2]
4Ryozou Yoshino [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)