| |
| 1995 | ||
|---|---|---|
| 1 | Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino: A Gate-Array-Based 666MHz VLSI Test System. ITC 1995: 451-458 | |
| 1 | Yoshihiko Hayashi | [1] |
| 2 | Masahiko Kaneko | [1] |
| 3 | Shuji Kikuchi | [1] |
| 4 | Takashi Matsumoto | [1] |
| 5 | Jun Saitou | [1] |
| 6 | Ryozou Yoshino | [1] |