Joonhwan Yi

List of publications from the DBLP Bibliography Server - FAQ

2006

3 EE Junghee Lee, Joonhwan Yi: Cycle error correction in asynchronous clock modeling for cycle-based simulation. ASP-DAC 2006: 460-465

2 EE Joonhwan Yi, John P. Hayes: High-level delay test generation for modular circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(3): 576-590 (2006)

2005

1 EE Joonhwan Yi, John P. Hayes: The Coupling Model for Function and Delay Faults. J. Electronic Testing 21(6): 631-649 (2005)

2006
3	EE	Junghee Lee, Joonhwan Yi: Cycle error correction in asynchronous clock modeling for cycle-based simulation. ASP-DAC 2006: 460-465
2	EE	Joonhwan Yi, John P. Hayes: High-level delay test generation for modular circuits. IEEE Trans. on CAD of Integrated Circuits and Systems 25(3): 576-590 (2006)
2005
1	EE	Joonhwan Yi, John P. Hayes: The Coupling Model for Function and Delay Faults. J. Electronic Testing 21(6): 631-649 (2005)

Coauthor Index