| |
| 2006 | ||
|---|---|---|
| 3 | EE | Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee: Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. J. Electronic Testing 22(4-6): 471-482 (2006) |
| 2003 | ||
| 2 | EE | Xiangdong Xuan, Abhijit Chatterjee, Adit D. Singh, Namsoo P. Kim, Mark T. Chisa: IC Reliability Simulator ARET and Its Application in Design-for-Reliability. Asian Test Symposium 2003: 18-23 |
| 2001 | ||
| 1 | EE | Xiangdong Xuan, Abhijit Chatterjee: Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. DFT 2001: 323-328 |
| 1 | Abhijit Chatterjee | [1] [2] [3] |
| 2 | Mark T. Chisa | [2] |
| 3 | Namsoo P. Kim | [2] |
| 4 | Adit D. Singh | [2] [3] |