| 2007 |
|---|
| 4 | EE | Y. P. Wu,
Q. P. Hu,
M. Xie,
S. H. Ng:
Modeling and Analysis of Software Fault Detection and Correction Process by Considering Time Dependency.
IEEE Transactions on Reliability 56(4): 629-642 (2007) |
| 2006 |
|---|
| 3 | EE | Y. P. Wu,
Q. P. Hu,
M. Xie,
S. H. Ng:
Detection and Correction Process Modeling Considering the Time Dependency.
PRDC 2006: 19-25 |
| 2005 |
|---|
| 2 | EE | Y. P. Wu,
Q. P. Hu,
S. H. Ng,
M. Xie:
Bayesian Networks Modeling for Software Inspection Effectiveness.
PRDC 2005: 65-74 |
| 2004 |
|---|
| 1 | EE | Y. P. Wu,
M. O. Alam,
Y. C. Chan,
B. Y. Wu:
Dynamic strength of anisotropic conductive joints in flip chip on glass and flip chip on flex packages.
Microelectronics Reliability 44(2): 295-302 (2004) |
