R. Weiland

2005
2	EE	U. Muehle, A. Lenk, R. Weiland, H. Lichte: Characterisation of dopants distribution using electron holography and FIB-based lift-off preparation. Microelectronics Reliability 45(9-11): 1558-1561 (2005)
2003
1	EE	B. Simmnacher, R. Weiland, J. Höhne, F. v. Feilitzsch, C. Hollerith: Semiconductor material analysis based on microcalorimeter EDS. Microelectronics Reliability 43(9-11): 1675-1680 (2003)

Coauthor Index

1	F. v. Feilitzsch	[1]
2	J. Höhne	[1]
3	C. Hollerith	[1]
4	A. Lenk	[2]
5	H. Lichte	[2]
6	U. Muehle	[2]
7	B. Simmnacher	[1]

Colors in the list of coauthors