| |
| 2005 | ||
|---|---|---|
| 1 | EE | U. Muehle, A. Lenk, R. Weiland, H. Lichte: Characterisation of dopants distribution using electron holography and FIB-based lift-off preparation. Microelectronics Reliability 45(9-11): 1558-1561 (2005) |
| 1 | A. Lenk | [1] |
| 2 | H. Lichte | [1] |
| 3 | R. Weiland | [1] |