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| 2003 | ||
|---|---|---|
| 1 | EE | B. Simmnacher, R. Weiland, J. Höhne, F. v. Feilitzsch, C. Hollerith: Semiconductor material analysis based on microcalorimeter EDS. Microelectronics Reliability 43(9-11): 1675-1680 (2003) |
| 1 | F. v. Feilitzsch | [1] |
| 2 | J. Höhne | [1] |
| 3 | B. Simmnacher | [1] |
| 4 | R. Weiland | [1] |