Walter W. Weber

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1997

3 EE Walter W. Weber, Adit D. Singh: Incorporating I_DDQ Testing with BIST for Improved Coverage: An Experimental Study. J. Electronic Testing 11(2): 147-156 (1997)

1995

2 Adit D. Singh, Haroon Rasheed, Walter W. Weber: I_DDQ Testing of CMOS Opens: An Experimental Study. ITC 1995: 479-489

1 EE Walter W. Weber, Adit D. Singh: An experimental evaluation of the differential BICS for I/sub DDQ/ testing. VTS 1995: 472-485

1997
3	EE	Walter W. Weber, Adit D. Singh: Incorporating I_DDQ Testing with BIST for Improved Coverage: An Experimental Study. J. Electronic Testing 11(2): 147-156 (1997)
1995
2		Adit D. Singh, Haroon Rasheed, Walter W. Weber: I_DDQ Testing of CMOS Opens: An Experimental Study. ITC 1995: 479-489
1	EE	Walter W. Weber, Adit D. Singh: An experimental evaluation of the differential BICS for I/sub DDQ/ testing. VTS 1995: 472-485

Coauthor Index

1 Haroon Rasheed [2]

2 Adit D. Singh [1] [2] [3]