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Haroon Rasheed

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1995
2 Adit D. Singh, Haroon Rasheed, Walter W. Weber: IDDQ Testing of CMOS Opens: An Experimental Study. ITC 1995: 479-489
1EEPuneet Sawhney, Haroon Rasheed: Static RAM generators with automated characterization techniques for a 0.5 micron triple-metal embedded array. VLSI Design 1995: 191-

Coauthor Index

1Puneet Sawhney [1]
2Adit D. Singh [2]
3Walter W. Weber [2]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)