1996 |
3 | EE | James F. Ziegler,
Huntington W. Curtis,
Hans P. Muhlfeld,
Charles J. Montrose,
B. Chin,
Michael Nicewicz,
C. A. Russell,
Wen Y. Wang,
Leo B. Freeman,
P. Hosier,
L. E. LaFave,
James L. Walsh,
José M. Orro,
G. J. Unger,
John M. Ross,
Timothy J. O'Gorman,
B. Messina,
Timothy D. Sullivan,
A. J. Sykes,
H. Yourke,
Thomas A. Enger,
Vikram R. Tolat,
T. S. Scott,
Allen H. Taber,
R. J. Sussman,
W. A. Klein,
C. W. Wahaus:
IBM experiments in soft fails in computer electronics (1978-1994).
IBM Journal of Research and Development 40(1): 3-18 (1996) |
2 | | Timothy J. O'Gorman,
John M. Ross,
Allen H. Taber,
James F. Ziegler,
Hans P. Muhlfeld,
Charles J. Montrose,
Huntington W. Curtis,
James L. Walsh:
Field testing for cosmic ray soft errors in semiconductor memories.
IBM Journal of Research and Development 40(1): 41-50 (1996) |
1976 |
1 | | Robert A. Henle,
Irving T. Ho,
William S. Johnson,
W. David Pricer,
James L. Walsh:
The Application of Transistor Technology to Computers.
IEEE Trans. Computers 25(12): 1289-1303 (1976) |