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1996 | ||
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1 | EE | James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, H. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus: IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development 40(1): 3-18 (1996) |
1 | B. Chin | [1] |
2 | Huntington W. Curtis | [1] |
3 | Thomas A. Enger | [1] |
4 | Leo B. Freeman | [1] |
5 | P. Hosier | [1] |
6 | W. A. Klein | [1] |
7 | L. E. LaFave | [1] |
8 | Charles J. Montrose | [1] |
9 | Hans P. Muhlfeld | [1] |
10 | Michael Nicewicz | [1] |
11 | Timothy J. O'Gorman | [1] |
12 | José M. Orro | [1] |
13 | John M. Ross | [1] |
14 | C. A. Russell | [1] |
15 | T. S. Scott | [1] |
16 | Timothy D. Sullivan | [1] |
17 | R. J. Sussman | [1] |
18 | A. J. Sykes | [1] |
19 | Allen H. Taber | [1] |
20 | Vikram R. Tolat | [1] |
21 | G. J. Unger | [1] |
22 | C. W. Wahaus | [1] |
23 | James L. Walsh | [1] |
24 | Wen Y. Wang | [1] |
25 | H. Yourke | [1] |
26 | James F. Ziegler | [1] |