Leo B. Freeman

1996
2		Leo B. Freeman: Critical charge calculations for a bipolar SRAM array. IBM Journal of Research and Development 40(1): 119-130 (1996)
1	EE	James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, H. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus: IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development 40(1): 3-18 (1996)

Coauthor Index

1	B. Chin	[1]
2	Huntington W. Curtis	[1]
3	Thomas A. Enger	[1]
4	P. Hosier	[1]
5	W. A. Klein	[1]
6	L. E. LaFave	[1]
7	B. Messina	[1]
8	Charles J. Montrose	[1]
9	Hans P. Muhlfeld	[1]
10	Michael Nicewicz	[1]
11	Timothy J. O'Gorman	[1]
12	José M. Orro	[1]
13	John M. Ross	[1]
14	C. A. Russell	[1]
15	T. S. Scott	[1]
16	Timothy D. Sullivan	[1]
17	R. J. Sussman	[1]
18	A. J. Sykes	[1]
19	Allen H. Taber	[1]
20	Vikram R. Tolat	[1]
21	G. J. Unger	[1]
22	C. W. Wahaus	[1]
23	James L. Walsh	[1]
24	Wen Y. Wang	[1]
25	H. Yourke	[1]
26	James F. Ziegler	[1]