Charles J. Montrose

1996
3	EE	James F. Ziegler, Huntington W. Curtis, Hans P. Muhlfeld, Charles J. Montrose, B. Chin, Michael Nicewicz, C. A. Russell, Wen Y. Wang, Leo B. Freeman, P. Hosier, L. E. LaFave, James L. Walsh, José M. Orro, G. J. Unger, John M. Ross, Timothy J. O'Gorman, B. Messina, Timothy D. Sullivan, A. J. Sykes, H. Yourke, Thomas A. Enger, Vikram R. Tolat, T. S. Scott, Allen H. Taber, R. J. Sussman, W. A. Klein, C. W. Wahaus: IBM experiments in soft fails in computer electronics (1978-1994). IBM Journal of Research and Development 40(1): 3-18 (1996)
2		Timothy J. O'Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh: Field testing for cosmic ray soft errors in semiconductor memories. IBM Journal of Research and Development 40(1): 41-50 (1996)
1		James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, Timothy J. O'Gorman, John M. Ross: Accelerated testing for cosmic soft-error rate. IBM Journal of Research and Development 40(1): 51-72 (1996)

Coauthor Index

1	B. Chin	[3]
2	Huntington W. Curtis	[1] [2] [3]
3	Thomas A. Enger	[3]
4	Leo B. Freeman	[3]
5	P. Hosier	[3]
6	W. A. Klein	[3]
7	L. E. LaFave	[3]
8	B. Messina	[3]
9	Hans P. Muhlfeld	[1] [2] [3]
10	Michael Nicewicz	[3]
11	Timothy J. O'Gorman	[1] [2] [3]
12	José M. Orro	[3]
13	John M. Ross	[1] [2] [3]
14	C. A. Russell	[3]
15	T. S. Scott	[3]
16	Timothy D. Sullivan	[3]
17	R. J. Sussman	[3]
18	A. J. Sykes	[3]
19	Allen H. Taber	[2] [3]
20	Vikram R. Tolat	[3]
21	G. J. Unger	[3]
22	C. W. Wahaus	[3]
23	James L. Walsh	[2] [3]
24	Wen Y. Wang	[3]
25	H. Yourke	[3]
26	James F. Ziegler	[1] [2] [3]