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T. Sullivan

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2006
1EEF. Chen, J. Gill, D. Harmon, T. Sullivan, A. Strong, B. Li, H. Rathore, Daniel C. Edelstein: Determination of the thermal conductivity of composite low-k dielectrics for advanced interconnect structures. Microelectronics Reliability 46(2-4): 232-243 (2006)

Coauthor Index

1F. Chen [1]
2Daniel C. Edelstein [1]
3J. Gill [1]
4D. Harmon [1]
5B. Li [1]
6H. Rathore [1]
7A. Strong [1]

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