Yong-Ha Song

2003
2	EE	Yong-Ha Song, S. G. Kim, S. B. Lee, K. J. Rhee, T. S. Kim: A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology. Microelectronics Reliability 43(9-11): 1405-1410 (2003)
2002
1	EE	Yong-Ha Song, Myoung-Lae Park, Gye-Won Jung, Taek-Soo Kim: A study of advanced layout verification to prevent leakage current failure during power down mode operation. Microelectronics Reliability 42(9-11): 1385-1388 (2002)

Coauthor Index

1	Gye-Won Jung	[1]
2	S. G. Kim	[2]
3	T. S. Kim	[2]
4	Taek-Soo Kim	[1]
5	S. B. Lee	[2]
6	Myoung-Lae Park	[1]
7	K. J. Rhee	[2]

Colors in the list of coauthors