| |
| 2002 | ||
|---|---|---|
| 1 | EE | Yong-Ha Song, Myoung-Lae Park, Gye-Won Jung, Taek-Soo Kim: A study of advanced layout verification to prevent leakage current failure during power down mode operation. Microelectronics Reliability 42(9-11): 1385-1388 (2002) |
| 1 | Taek-Soo Kim | [1] |
| 2 | Myoung-Lae Park | [1] |
| 3 | Yong-Ha Song | [1] |