K. J. Rhee

2003
1	EE	Yong-Ha Song, S. G. Kim, S. B. Lee, K. J. Rhee, T. S. Kim: A study of considering the reliability issues on ASIC/Memory integration by SIP (System-in-Package) technology. Microelectronics Reliability 43(9-11): 1405-1410 (2003)

Coauthor Index

1	S. G. Kim	[1]
2	T. S. Kim	[1]
3	S. B. Lee	[1]
4	Yong-Ha Song	[1]