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2005 | ||
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1 | EE | P. Benoit, J. Raoult, C. Delseny, F. Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, O. Noblanc: Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. Microelectronics Reliability 45(9-11): 1800-1806 (2005) |
1 | P. Benoit | [1] |
2 | D. Cottin | [1] |
3 | C. Delseny | [1] |
4 | M. Marin | [1] |
5 | B. Martinet | [1] |
6 | O. Noblanc | [1] |
7 | F. Pascal | [1] |
8 | J. Raoult | [1] |
9 | J. C. Vildeuil | [1] |