C. Delseny

2005
1	EE	P. Benoit, J. Raoult, C. Delseny, F. Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, O. Noblanc: Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. Microelectronics Reliability 45(9-11): 1800-1806 (2005)

Coauthor Index

1	P. Benoit	[1]
2	D. Cottin	[1]
3	M. Marin	[1]
4	B. Martinet	[1]
5	O. Noblanc	[1]
6	F. Pascal	[1]
7	J. Raoult	[1]
8	L. Snadny	[1]
9	J. C. Vildeuil	[1]