| |
| 2005 | ||
|---|---|---|
| 1 | EE | P. Benoit, J. Raoult, C. Delseny, F. Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, O. Noblanc: Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. Microelectronics Reliability 45(9-11): 1800-1806 (2005) |
| 1 | P. Benoit | [1] |
| 2 | D. Cottin | [1] |
| 3 | C. Delseny | [1] |
| 4 | M. Marin | [1] |
| 5 | B. Martinet | [1] |
| 6 | O. Noblanc | [1] |
| 7 | F. Pascal | [1] |
| 8 | L. Snadny | [1] |
| 9 | J. C. Vildeuil | [1] |