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J. Raoult

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2005
1EEP. Benoit, J. Raoult, C. Delseny, F. Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, O. Noblanc: Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors. Microelectronics Reliability 45(9-11): 1800-1806 (2005)

Coauthor Index

1P. Benoit [1]
2D. Cottin [1]
3C. Delseny [1]
4M. Marin [1]
5B. Martinet [1]
6O. Noblanc [1]
7F. Pascal [1]
8L. Snadny [1]
9J. C. Vildeuil [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)