Frank Siegelin

2006
2	EE	Liming Gao, Christian Burmer, Frank Siegelin: ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. Microelectronics Reliability 46(9-11): 1458-1463 (2006)
1	EE	Zhongling Qian, Frank Siegelin, Birgit Tippelt, Stefan Müller: Localization and physical analysis of a complex SRAM failure in 90nm technology. Microelectronics Reliability 46(9-11): 1558-1562 (2006)

Coauthor Index

1	Christian Burmer	[2]
2	Liming Gao	[2]
3	Stefan Müller	[1]
4	Zhongling Qian	[1]
5	Birgit Tippelt	[1]

Colors in the list of coauthors