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| 2006 | ||
|---|---|---|
| 1 | EE | Zhongling Qian, Frank Siegelin, Birgit Tippelt, Stefan Müller: Localization and physical analysis of a complex SRAM failure in 90nm technology. Microelectronics Reliability 46(9-11): 1558-1562 (2006) |
| 1 | Stefan Müller | [1] |
| 2 | Zhongling Qian | [1] |
| 3 | Frank Siegelin | [1] |