Christian Burmer

2006
2	EE	Liming Gao, Christian Burmer, Frank Siegelin: ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. Microelectronics Reliability 46(9-11): 1458-1463 (2006)
1	EE	Christian Burmer, Siegfried Görlich: Failure analyses for debug and ramp-up of modern IC's. Microelectronics Reliability 46(9-11): 1486-1497 (2006)

Coauthor Index

1	Liming Gao	[2]
2	Siegfried Görlich	[1]
3	Frank Siegelin	[2]

Colors in the list of coauthors