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Liming Gao

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2006
1EELiming Gao, Christian Burmer, Frank Siegelin: ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. Microelectronics Reliability 46(9-11): 1458-1463 (2006)

Coauthor Index

1Christian Burmer [1]
2Frank Siegelin [1]

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