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| 2006 | ||
|---|---|---|
| 1 | EE | Liming Gao, Christian Burmer, Frank Siegelin: ATPG scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement. Microelectronics Reliability 46(9-11): 1458-1463 (2006) |
| 1 | Christian Burmer | [1] |
| 2 | Frank Siegelin | [1] |