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Hsi-Ching Shih

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1986
2EEHsi-Ching Shih, Jacob A. Abraham: Transistor-level test generation for physical failures in CMOS circuits. DAC 1986: 243-249
1EEHsi-Ching Shih, Joseph T. Rahmeh, Jacob A. Abraham: FAUST: An MOS Fault Simulator with Timing Information. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 557-563 (1986)

Coauthor Index

1Jacob A. Abraham [1] [2]
2Joseph T. Rahmeh [1]

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