1986 | ||
---|---|---|
2 | EE | Hsi-Ching Shih, Jacob A. Abraham: Transistor-level test generation for physical failures in CMOS circuits. DAC 1986: 243-249 |
1 | EE | Hsi-Ching Shih, Joseph T. Rahmeh, Jacob A. Abraham: FAUST: An MOS Fault Simulator with Timing Information. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 557-563 (1986) |
1 | Jacob A. Abraham | [1] [2] |
2 | Joseph T. Rahmeh | [1] |