| 1999 |
|---|
| 4 | EE | Yuhai Ma,
Wanchun Shi:
Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs.
J. Electronic Testing 14(3): 273-293 (1999) |
| 1997 |
|---|
| 3 | | Yuhai Ma,
Wanchun Shi:
OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs.
ITC 1997: 675-684 |
| 1996 |
|---|
| 2 | | Yuhai Ma,
Wanchun Shi:
A Novel Approach to the Analysis of VLSI Device Test Programs.
ITC 1996: 471-480 |
| 1994 |
|---|
| 1 | | Yuning Sun,
Xiaoming Wang,
Wanchun Shi:
An Intelligent Software-Integrated Environment of IC Testing.
ITC 1994: 594-603 |
