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Wanchun Shi

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1999
4EEYuhai Ma, Wanchun Shi: Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. J. Electronic Testing 14(3): 273-293 (1999)
1997
3 Yuhai Ma, Wanchun Shi: OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. ITC 1997: 675-684
1996
2 Yuhai Ma, Wanchun Shi: A Novel Approach to the Analysis of VLSI Device Test Programs. ITC 1996: 471-480
1994
1 Yuning Sun, Xiaoming Wang, Wanchun Shi: An Intelligent Software-Integrated Environment of IC Testing. ITC 1994: 594-603

Coauthor Index

1Yuhai Ma [2] [3] [4]
2Yuning Sun [1]
3Xiaoming Wang [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)