| |
| 1999 | ||
|---|---|---|
| 3 | EE | Yuhai Ma, Wanchun Shi: Intelligent Analysis and Off-Line Debugging of VLSI Device Test Programs. J. Electronic Testing 14(3): 273-293 (1999) |
| 1997 | ||
| 2 | Yuhai Ma, Wanchun Shi: OLDEVDTP: A Novel Environment for Off-Line Debugging of VLSI Device Test Programs. ITC 1997: 675-684 | |
| 1996 | ||
| 1 | Yuhai Ma, Wanchun Shi: A Novel Approach to the Analysis of VLSI Device Test Programs. ITC 1996: 471-480 | |
| 1 | Wanchun Shi | [1] [2] [3] |