| |
| 2006 | ||
|---|---|---|
| 2 | EE | Huawei Li, Pei-Fu Shen, Xiaowei Li: Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. VTS 2006: 300-305 |
| 2005 | ||
| 1 | EE | Pei-Fu Shen, Huawei Li, Yongjun Xu, Xiaowei Li: Non-robust Test Generation for Crosstalk-Induced Delay Faults. Asian Test Symposium 2005: 120-125 |
| 1 | Huawei Li | [1] [2] |
| 2 | Xiaowei Li | [1] [2] |
| 3 | Yongjun Xu | [1] |