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N. Y. A. Shammas

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2003
3EEN. Y. A. Shammas: Present problems of power module packaging technology. Microelectronics Reliability 43(4): 519-527 (2003)
2002
2EEN. Y. A. Shammas, M. P. Rodriguez, F. Masana: A simple method for evaluating the transient thermal response of semiconductor devices. Microelectronics Reliability 42(1): 109-117 (2002)
2001
1EEM. P. Rodriguez, N. Y. A. Shammas: Finite element simulation of thermal fatigue in multilayer structures: thermal and mechanical approach. Microelectronics Reliability 41(4): 517-523 (2001)

Coauthor Index

1F. Masana [2]
2M. P. Rodriguez [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)