| |
| 2002 | ||
|---|---|---|
| 2 | EE | N. Y. A. Shammas, M. P. Rodriguez, F. Masana: A simple method for evaluating the transient thermal response of semiconductor devices. Microelectronics Reliability 42(1): 109-117 (2002) |
| 2001 | ||
| 1 | EE | M. P. Rodriguez, N. Y. A. Shammas: Finite element simulation of thermal fatigue in multilayer structures: thermal and mechanical approach. Microelectronics Reliability 41(4): 517-523 (2001) |
| 1 | F. Masana | [2] |
| 2 | N. Y. A. Shammas | [1] [2] |