Keith McCasland
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2001
1
EE
Ron Ross
, Keith McCasland: Early Detection of Design Sensitivities that Cause Yield Loss for New Products.
ISQED 2001
: 427-430
Coauthor
Index
1
Ron Ross
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)