| 2007 |
|---|
| 3 | EE | Xiao-Ming Wu,
Jianyuan Yu,
Tianling Ren,
Litian Liu:
Micro-Raman spectroscopy measurement of stress in silicon.
Microelectronics Journal 38(1): 87-90 (2007) |
| 2005 |
|---|
| 2 | EE | Xiao-Ming Wu,
Ning-xin Zhang,
Tianling Ren,
Litian Liu:
Nondestructive Evaluation of MEMS Devices by Laser Confocal Measurements.
ICMENS 2005: 69-76 |
| 2004 |
|---|
| 1 | | Haibo Long,
Zhenghe Feng,
Haigang Feng,
Albert Z. Wang,
Tianling Ren:
L-simulator: a magPEEC-based new CAD tool for simulating magnetic-enhanced IC inductors of 3D arbitrary geometry.
ISCAS (5) 2004: 233-237 |
