| 2007 |
|---|
| 3 | EE | Xiao-Ming Wu,
Jianyuan Yu,
Tianling Ren,
Litian Liu:
Micro-Raman spectroscopy measurement of stress in silicon.
Microelectronics Journal 38(1): 87-90 (2007) |
| 2005 |
|---|
| 2 | EE | Xiao-Ming Wu,
Ning-xin Zhang,
Tianling Ren,
Litian Liu:
Nondestructive Evaluation of MEMS Devices by Laser Confocal Measurements.
ICMENS 2005: 69-76 |
| 2001 |
|---|
| 1 | EE | Yutao Ma,
Litian Liu,
Lilin Tian,
Zhiping Yu,
Zhijian Li:
Analytical charge-control and I-V model for submicrometer anddeep-submicrometer MOSFETs fully comprising quantum mechanical effects.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(4): 495-502 (2001) |
