Jianyuan Yu
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2007
1
EE
Xiao-Ming Wu
, Jianyuan Yu,
Tianling Ren
,
Litian Liu
: Micro-Raman spectroscopy measurement of stress in silicon.
Microelectronics Journal 38
(1): 87-90 (2007)
Coauthor
Index
1
Litian Liu
[
1
]
2
Tianling Ren
[
1
]
3
Xiao-Ming Wu
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
