M. Röhner

2006
1	EE	T. Pompl, A. Kerber, M. Röhner, M. Kerber: Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides. Microelectronics Reliability 46(9-11): 1603-1607 (2006)

Coauthor Index

1	A. Kerber	[1]
2	M. Kerber	[1]
3	T. Pompl	[1]