| |
| 2008 | ||
|---|---|---|
| 1 | EE | Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731 |
| 1 | Kunhyuk Kang | [1] |
| 2 | Sang Phill Park | [1] |
| 3 | Kaushik Roy | [1] |