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Saakshi Gangwal

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2008
1EEKunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731

Coauthor Index

1Kunhyuk Kang [1]
2Sang Phill Park [1]
3Kaushik Roy [1]

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